プロファイル解析による積層不整の研究
2004 年 46 巻 6 号 p. 407-414
詳細
2004 年 46 巻 6 号 p. 407-414
Computer simulation method of powder diffraction profile from the specimen with planer defects such as stacking faults and intergrowth is reviewed. The matrix method, introduced by Hendricks and Teller and developed to the general solution method by Kakinoki and Komura, is summarized, and transformation into the powder pattern profile is presented in outline. Probability matrices of layer sequences and calculated profiles using the matices are reported for several examples, SiC, Li-Mn-oxide, Cu3GdS3 and Bi1.83Sr1.80Ca1.78Cu3Oy.
