検出器多連装型高分解能回折計を用いた放射光粉末回折測定の進展
2007 年 49 巻 6 号 p. 347-353
詳細
2007 年 49 巻 6 号 p. 347-353
Recent development of synchrotron powder diffractometry with a high resolution powder diffractometer with multiple-detector system (MDS) on the beemline BL-4B2 at the KEK Photon Factory (PF) in Tsukuba is described. Practical methods for analyzing the MDS data, including (i) precise evaluation and correction for counting-loss of detection systems, (ii) connection of segmented intensity data, (iii) deconvolution of instrumental aberration, and (iv) evaluation and removal of asymmetry in the spectroscopic distribution of the source X-ray, have been originally developed for the MDS diffractometer. It is shown that the KEK-PF MDS powder diffractometer has become a more advanced tool for precise and detailed evaluation of crystalline materials.
