試料の冷却に引き上げ法を用いた低温における比熱測定
1972 年 7 巻 5 号 p. 254-259
詳細
1972 年 7 巻 5 号 p. 254-259
The specific heat measurement at low temperatures has been described. In this apparatus we have used a mechanical heat switch with which the thermal contact is done by bringing up a specimen and pressing against the liquid helium temperature part. The specific heat has been measured about some specimens using this apparatus.
