Bulk-etch Rate of CR-39 Detector under Various Conditions of Temperature and Concentration of NaOH Solution

抄録

Bulk-etch rate (V_B) is one of the most fundamental characteristics in solid state nuclear track detector (SSNTD). For CR-39, a new important SSNTD, the V_B was measured by changing the concentration of NaOH solution from 10 to 30% and the etching temperature from 50 to 70°C. The amount removed by etching was determined by measuring the thickness of detector before and after etching with a micrometer. The detector absorbed water and subsequently swelled. A way to remove the water was obtained, which raised the reliability in the measurements. The V_B was found to be constant during etching and 1.18×10¹⁰ exp (0.122×C)·exp(-8.74×10³.1/T) (μm/h), where C and T are the concentration (%) and the temperature (°K) of etchant respectively. The activation energy was calculated and found to be 0.75eV.