JOURNAL OF THE ILLUMINATING ENGINEERING INSTITUTE OF JAPAN
Online ISSN : 1349-838X
Print ISSN : 0019-2341
ISSN-L : 0019-2341
Determination of the Photometric Quantities based on the Silicon Photodiode Absolute Responsivity Measurement and its Accuracy
Yoshihiro OhnoKenichi SuzukiHideo Nishiyama
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1991 Volume 75 Issue 10 Pages 571-576

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Abstract

The absolute spectral responsivity of inversion layer type silicon photodiodes in the visible region has been determined by the self-calibration measurements on four wavelengths and interpolation. Using the calibrated photodiodes in combination with a V (λ) filter and a precision aperture, a photometric standard detector has been constructed. The spectral transmittance of the filter was measured by a method which can eliminate, in principle, the errors caused by the interreflections between the filter and the photodiode surface, and the errors caused by the spatial non-uniformity of the transmittance of the filter. The calibrated detector was compared with a working luminous intensity standard lamp supplied from ETL (Electrotechnical Laboratory) of Japan, and also with luminous intensity standard lamps maintained at NIST of the U. S. The luminous intensity measured by the detector agreed with the values of ETL and NIST within a 0.5% difference.

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