JOURNAL OF THE ILLUMINATING ENGINEERING INSTITUTE OF JAPAN
Online ISSN : 1349-838X
Print ISSN : 0019-2341
ISSN-L : 0019-2341
Calibration of 253.7nm irradiance based on the silicon photodiode self-calibration technique (2)
Analysis of the uncertainties
Kazuaki OhkuboYoshihiro OhnoYasuo Nakagawa
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JOURNAL FREE ACCESS

1991 Volume 75 Issue 6 Pages 282-287

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Abstract

An attempt was made to intercompare the accuracy for the 3 methods of 253.7nm irradiance calibration. The first method, which we have already reported, is based on the silicon photodiode self-calibration technique. In this method, the absolute responsivity at 253.7nm of the photodiode was determined by the absolute responsivity at 632.8nm calibrated by the self-calibration technique and the relative spectral responsivity measurement. The second method uses a thermal detector calibrated by standard lamps and optical filters. The third method is a comparison measurement with the blackbody using a monochromator. The scales of 253.7nm irradiance realized by the three methods agreed within 1.5% and it is confirmed that each method has sufficient accuracy for primary standards of the 253.7nm irradiance.

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© The Illuminating Engineering Institute of Japan
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