エレクトロニクス実装学会誌
Online ISSN : 1884-121X
Print ISSN : 1343-9677
電子部品検査用メッシュプローブ
太田 佳秀花岡 裕二廣繁 勝也
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2003 年 6 巻 3 号 p. 254-259

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A membrane-type material used in electronic circuit inspections was developed. This material can be used to produce narrow pitches at a low cost. It has a durability under repeated tests, up to 1 million runs using a QFN (Quad Flat Non-leaded package) . When examined, the characteristics of electricity, conductor resistance, insulation resistance, withstand voltage and current-carrying capacity were tested. It was confirmed that the acceptable level was achieved without any problems as a contact probe.

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