Abstract
Co/Pd and Co/Au multilayered structures were determined from a comparison between X-ray scattering measurements and calculations. Particularly, the calculation model, in which a fluctuation of lattice spacings in the alloyed interlayers is taken into consideration, gives much better profile fittings than a fixed lattice spacing model. Multilayered structure was fabricated by a high quality periodicity, and scattering profile fittings revealed that the fluctuations of periodic thickness were less than 1 ML in both films. The fluctuation of periodic thickness ΔΛ was 0.105 nm in Co/Pd and 0.110 nm in Co/Au, where ΔΛ is a Gaussian distribution width of periodic thickness Λ. The fluctuation of periodic thickness was nearly the same for both films. On the other hand, the interlayer thickness was about 3.5 atomic layers in Co/Pd and about 2 atomic layers in Co/Au. The fact that Co/Au film has much steeper interface than Co/Pd is explained by considering that Au and Co are a eutectic system while Pd and Co are an isomorphous system.
