2003 年 30 巻 3 号 p. 12-
Niobium-doped lead zirconate stannate titanate (PNZST) AFE films have been prepared on Nb-doped SrTiO_3(100) substrates by an annealing method via a pulsed laser deposition (PLD) technique. For the characterization of the PNZST AFE films, X-ray diffraction (XRD) and atomic force microscopy (AFM) were used. For the first time, epitaxial growth orientation of the PNZST was found to be <001>.