セグメント法によるLSF

抄録

The purpose of this paper is to present a description of a proposal of the segment method, its use and its performance. When film is used for the recording system, the trucation error is caused by its nonlinearity inevitably. This truncation error may be decreased by the slit multiple exposure technique. However, the method by which LSF can be measured more simply and exactly than the slit method is required. We designed the segment method in place of the slit method. Except that the X-ray intensity distribution obtained by the slit method is plus and the intensity distribution by the segment method is minus, both distributions are equivalent. It was found that LSF of the slit method corrected with the multiple exposure technique agrees with that of the segment single exposure method. This new method is available for LSF measurement with film.