日本放射線技術学会雑誌
Online ISSN : 1881-4883
Print ISSN : 0369-4305
ISSN-L : 0369-4305
CRシステムにおけるIPへの入射X線量とS値の関係 : 均一照射における定量的評価
辰己 大作白石 順二對間 博之久住 謙一宇都宮 あかね
著者情報
ジャーナル フリー

1998 年 54 巻 11 号 p. 1273-1280

詳細
抄録

Practical experiments were done to quantify basic properties of the imaging plate(IP). The relation was investigated between incident dose on the IP and the S value associated with computed radiography. An acrylic phantom and uniform exposure were used for this study. The effects of the properties of incident dose(tube voltage, exposed dose, and grid application) and IP(fading time and period of use) on the S value were measured. Results indicated that determination of the S value depended on tube voltage and fading of the IP, but not on exposure dose or period of IP usage. The effects of grid use could be estimated with the grid's bucky factor and scattering factors. We concluded that these results were useful for research using the IP as an x-ray detector and for estimating incident dose by using the S value.

著者関連情報
© 1998 公益社団法人 日本放射線技術学会
前の記事 次の記事
feedback
Top