診断用X線撮影装置を用いたCdTe検出器の応答関数の実測とモンテカルロシミュレーションコードの評価

抄録

An X-ray spectrum measured with CdTe detector has to be corrected with response function, because the spectrum is composed of full energy peaks (FEP) and escape peaks (EP). Recently, various simulation codes were developed, and using them the response functions can be calculated easily. The aim of this study is to propose a new method for measuring the response function and to compare it with the calculated value by the Monte Carlo simulation code. In this study, characteristic X-rays were used for measuring the response function. These X-rays were produced by the irradiation of diagnostic X-rays with metallic atoms. In the measured spectrum, there was a background contamination, which was caused by the Compton scattering of the irradiated X-ray in the sample material. Therefore, we thought of a new experimental methodology to reduce this background. The experimentally derived spectrum was analyzed and then the ratios of EP divided by FEP (EP/FEP) were calculated to compare the simulated values. In this article, we showed the property of the measured response functions and the analysis accuracy of the EP/FEP, and we indicated that the values calculated by Monte Carlo simulation code could be evaluated by using our method.