精密工学会誌
Online ISSN : 1882-675X
Print ISSN : 0912-0289
ISSN-L : 0912-0289
InGaAs/GaAs単一ひずみ量子井戸薄膜の低温成長に関する研究
安武 潔竹内 昭博垣内 弘章奥山 佳正芳井 熊安川邊 秀昭
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1997 年 63 巻 1 号 p. 60-64

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InGaAs/GaAs strained-layer single quantum well (SSQW) structures have been grown at temperatures from 200 to 540°C by migration enhanced epitaxy (MEE). Fabricated structures were characterized by comparing the measured wavelength of photoluminescence (PL) emission peak with the theoretically calculated one for ideal quantum wells. In the SSQWs made at high temperatures (400 - 540°C), large PL peak shifts to the shorter wavelengths than the calculated ones were observed. This blue shift of the PL peak was attributed to the surface segregation and desorption of In atoms. Lowering the growth temperature of MEE below 300°C, the In segregation was suppressed and the designed PL wavelength from the SSQW was obtained. It was shown that the preparation of GaAs (2 × 4) -As surface without excess Assticking and the long migration time of group III atoms were needed to obtain the high PL intensity from SSQW.

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