19 巻 (1995) 2 号 p. 389-392
Interlayer exchange-coupling strength was studied by using ferromagnetic resonance (FMR) for 80Ni-Fe/Cu/Co trilayer films prepared on glass substrates by magnetron sputtering. The oscillation of two resonance fields that originated from interlayer exchange-coupling was observed. The period of the oscillation as a function of the Cu layer thickness agreed with that of the magnetoresistance. Using these results, we evaluated the exchange-coupling strength on the basis of the resonance model of a magnetically coupled trilayer system. The existence of antiferromagnetic coupling in the vicinity of both the first and second peaks of magnetoresistance was confirmed by this analysis.