Abstract
Giant magnetoresistance (GMR)in Co/Cu metallic multilayers was measured with a current perpendicular to the plane (CPP) at room temperature. Micro-pillar structures with a height of 1.0μm and widths ranging from 15 to 25 μm, fabricated by using optical lithography and Ar ion etching techniques, were used for the measurement. The CPP MR in Co (3 nm)/Cu (2 nm) multilayers was found to be 2.5 times larger than the MR with a current in the film plane (CIP).
