SHAPE CHARACTERISATION OF MAGNETO-OPTICALLY WRITTEN BITS USING PARAMETRIC FOURIER DESCRIPTORS

Abstract

  In this paper, an approach to characterizing the shape of recorded bits is presented. This approach uses parametric Fourier descriptors (FDs). Some of the properties of FDs are discussed, and it is shown how FDs can be used to formulate a useful measure for shape irregularity, which is related to Signal to Noise ratio. Finally, it is shown that such a measure can be applied to characterize the shape of magneto-optically written bits, measured using MFM.