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日本応用磁気学会誌
Vol. 21 (1997) No. 4_2 P 209-212

記事言語:

http://doi.org/10.3379/jmsjmag.21.209

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CoCrTaPt/Cr thin-film magnetic recording media were prepared by dc magnetron sputtering onto circum-ferentially textured NiP/Al substrates at various substrate temperatures and substrate bias voltages. The in-plane crystallographic structure analyzed by laboratory X-ray diffraction and grazing iwas ncidence X-ray diffraction using synchrotron radiation, and the correlation between the in-plane crystallographic structure and coercivity was studied. The coercivity was found to depend on both the in-plane c-axis population and strain. This suggests that both magnetocrystalline anisotropy and the inverse mag-netostrictive effect govern the coercivity and magnetic anisotropy. However, the in-plane crystallite size of a Co alloy layer was the same for any deposition parameters.

Copyright © 1997 (社)日本応用磁気学会

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