1998 年 22 巻 4_2 号 p. 293-296
A submicron track width of 0.4μm was observed by measuring an MFM image with a combination of a single-pole head and a perpendicular double-layered medium. Because of its sharp head field distribution, this combination is considered capable of obtaining a very narrow track-pitch. By measuring the off-track overwrite profiles with a thin-film single-pole flying head, we found that the erase band width was around 25 nm, which was acceptable for merged MR head and perpendicular double-layered medium.