2001 年 25 巻 4_2 号 p. 1059-1062
The magnetic properties of thin films with reduced lateral dimension are significantly different from those of materials in the bulk state, and have provided a wealth of scientific interest and potential technological applications. It is therefore very important to study magnetism in microstructures or small magnetic domains, and one of the most powerful tools for investigating such magnetism is the photoelectron emission microscope with synchrotron radiation as its light source (SR-PEEM).
We report in this paper our set-up of a new SR-PEEM system, and present the preliminary results.