Journal of the Magnetics Society of Japan
Online ISSN : 1880-4004
Print ISSN : 0285-0192
ISSN-L : 0285-0192
Perpendicular Recording
Optical Analysis of Magnetization Process Dependence on Film Depth for Perpendicular Thin-Film Media
S. SaitoY. HattaM. Takahashi
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JOURNAL OPEN ACCESS

2001 Volume 25 Issue 4_2 Pages 587-590

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Abstract
Heterogeneity of the perpendicular magnetization process dependence on film depth for CoNiCrTa and CoCrTaPt perpendicular thin-film media is discussed based on a magneto-optical analysis. Results show that: (1) by means of longitudinal Kerr equipment, evaluation for separating longitudinal magnetization of a columnar structure and initial layer is possible; (2) in a perpendicular magnetization process, the top of the medium has high coercive force and high squareness compared with the bottom of the medium; and (3) the top of the medium has homogeneous magnetization thicker than 25 nm, and the bottom has a thickness of about 10 nm. The top and bottom of the medium are considered to be a columnar structure and initial layer, respectively.
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© 2001 by The Magnetics Society of Japan
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