透過ローレンツ顕微鏡の偏向図形による磁壁構造の検出

抄録

High resolution deflection patterns of 200 kV transmission electron microscopy are presented demonstrating different structures of 180° walls in epitaxially grown (100) iron films and magnetostatically coupled layered films of polycrystalline iron.
In (100) iron films the structure of the 180° wall becomes more asymmetric not only across the wall thickness but also in the other two directions as the film thickness increases from 500 to 3000Å. When all the dimensions of crystalline grain, film thickness and wall thickness are 2000-3000Å. the 180° walls have fine structures which are modulated mainly by the grain.
In layered films less than 550Å in each dimention, the two coupled 180° walls frequently change between overlap-position and split-position, and the period of such shift varies from several μm to a few thousand angstroms depending on the film structure.