Polarization Interferometry of X-Ray Diffraction

抄録

A new type of X-ray diffraction interferometry is described, in which σ- and π-polarized X-rays diffracted by a sample crystal interfere with each other. A reversal of image contrast in ‘polarization interference topograph’ due to contrary sign of a spherical strain field in a crystal is demonstrated in terms of numerical simulations by Takagi-Taupin’s dynamical theory. Further, a feasibility of ‘polarization holography’ of X-ray diffraction is pointed out.