The 61st JSAP Spring Meeting 2014
Session ID : 17a-PG3-9
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 61
Location : [in Japanese]
Date : March 17, 2014 - March 20, 2014
Identification of Leak Point in SiC Devices Using High Sensitivity IR Thermograph
*Akihiro Koyama, Hiroshi Watanabe, Hidenori Koketsu, Akemi Nagae, Takanori Tanaka, Yosuke Nakanishi, Yu Nakamura, Shuhei Nakata, Satoshi Yamakawa
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