JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 62nd JSAP Spring Meeting 2015
Session ID : 13p-P17-17
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MOS characteristics of SiO2 deposited by plasma CVD on n-GaN substrate
*Katsunori UenoShinya TakashimaHideaki MatsuyamaMasaharu EdoKiyokazu Nakagawa
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Keywords: 13p-P17-17, GaN, MOS, interface
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© 2015 The Japan Society of Applied Physics
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