Journal of Advanced Science
Online ISSN : 1881-3917
Print ISSN : 0915-5651
In situ high-temperature X-ray observation of crystallization during the fabrication of non-silica (20ZnO·80TeO2) glass-preform of optical devices
Akihiko NUKUIShin-ichi TODOROKIMasaaki MIYATAYoshio BANDO
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2001 Volume 13 Issue 3 Pages 367-370

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Abstract

The crystallization behavior of zinctellirite (20ZnO·80TeO2) glass at different rates of heating and cooling were studied by an in situ high-temperature X-ray diffractometer (a rapid measurement system). During the heating process, α-TeO2 and ZnTeO3 were found to crystallize first, followed by the crystallization of Zn2Te3O8. While during the cooling process from melt, α-TeO2 was found to crystallize first, followed by the crystallization of Zn2Te3O8. The results of crystallization behavior of the 20ZnO·80TeO2 glass were compared with a Temperature-Time-Transfer diagram of the corresponding glass reported by Todoroki et al.

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