特集 — 地球深部物性研究の新展開 —
FIB 法による DAC 試料の TEM 薄膜試料作製
2008 年 18 巻 1 号 p. 38-43
詳細
2008 年 18 巻 1 号 p. 38-43
Analytical transmission electron microscope (ATEM) is a powerful tool for analyses of the samples recovered from ultrahigh pressure experiments. Recently, Focused Ion Beam (FIB) system has been applied to prepare a TEM foil of sample recovered from laser heated diamond anvil cell (LHDAC). It has some advantages compared to conventional argon ion milling method. In this article, recent advances in the DAC sample preparation for TEM observation using FIB system are reviewed.
