JSME International Journal Series A Solid Mechanics and Material Engineering
Online ISSN : 1347-5363
Print ISSN : 1344-7912
ISSN-L : 1344-7912
Sensitive Detection of Local Elasticity by Oscillating an AFM Cantilever with Its Mass Concentrated
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2002 Volume 45 Issue 4 Pages 567-572


In dynamic atomic force microscopy (AFM) for detecting local elastic properties of samples, it is desirable that the contact resonance of an AFM cantilever is sensitive to tip-sample contact stiffness. This paper presents a unique cantilever with its mass concentrated as a way of enhancing the sensitivity. The cantilever is made up of a commercially available normal cantilever and a tungsten particle adhesively attached to the free end. Spectra of the contact vibrations are measured for three sample materials. The mass-concentrating cantilever whose tip is in contact with a sample exhibits a distinguishing spectrum containing a meaningful resonant peak affected significantly by contact stiffness. If the attached mass is about four times larger than the distributed (cantilever) mass, the resonant peak obeys a spring-mass model. This means that the cantilever with its mass concentrated can provide the maximum sensitivity even for stiff materials.

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© 2002 by The Japan Society of Mechanical Engineers
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