抄録
In this paper, an approach to improve in sensitivity for detecting the phase-transformation (crystallization) of a thin film amorphous alloy is introduced. In combinatorial method for evaluating the crystallization temperature of thin film amorphous alloys using thermography, the crystallization is detected by change in thermal emissivity due to crystallization of the amorphous sample. In general, the emissivity is known to be dependent on material, and its surface conditions (for example, oxidation, and roughness). This study focused on surface roughness of the sample, the influence of the sample surface roughness on the change in the apparent emissivity due to the crystallization of the sample was examined. As results, the rate of the change in the apparent emissivity is amplified by adjusting the surface roughness, and the detection sensitivity of the transformation can be improved.
