主催: 一般社団法人 日本機械学会
会議名: 第10回マイクロ・ナノ工学シンポジウム
開催日: 2019/11/19 - 2019/11/21
This paper reports the relationship between electroencephalogram (EEG) and working memory . In the conventional measurement of EEG, we have used the wet electrode. Therefore, it is needed to grind of stratum corneum and apply electrolyte paste. This process gives the subjects discomfort and takes a lot of time for experiments. In oreder to solve these problems, we developed dry microneedle electrodes which can measure EEG without pretreatment. In this study, we measured EEG with dry microneedle electrodes during doing the memory test we made. The memory test consists of learning process and remembering process. We discovered the power spectrum density of θwave becomes higher in the process of remembering process than learning process. However, we cannot see the correlation between the result of the memory test and power spectrum density.