抄録
The development of the autofocus technology in the microscope is necessary and indispensable to automate work with a microscope. However, a current autofocus technology lacks at high speed, and is a bottleneck of the speed-up of the microscope measurement. Our group are proposing the technique for presuming the position on the focus side by using the diffraction pattern that appears when the cell is observed with the microscope, which we call "Depth From Diffraction". In this paper, we propose the algorithm to achieve the high-speed autofocus by the use of "Depth From Diffraction", and evaluate the effectiveness of it by experiment on the autofocus actually.
