抄録
This paper proposes a non-intrusive measurement technique for the ion concentration distributions at liquid-solid interfaces in microchannel flow using total internal reflection Raman imaging. The technique uses spontaneous Raman scattering excited by evanescent wave. The evanescent wave was generated at a glass-solution interface by total internal reflection using an optical system employing two prisms. The calibration result showed a linear relationship between the Raman intensity ratio and the ion concentration of NH_4Cl deuterium oxide solution. Using this calibration, further experiments will be performed for non-intrusive measurement of the ion concentration distributions in mixing area of D_2O and NH4Cl deuterium oxide solution at liquid-solid interfaces.
