Published: May 15, 1972Received: -Available on J-STAGE: June 03, 2009Accepted: March 09, 1972
Advance online publication: -
Revised: -
Correction information
Date of correction: June 03, 2009Reason for correction: -Correction: TITLEDetails: Wrong : LECTURE Right : X-Ray Method of Stress Measurement and its Application (I)
Date of correction: June 03, 2009Reason for correction: -Correction: AUTHORDetails: Right : K. Hayashi1)
Date of correction: June 03, 2009Reason for correction: -Correction: AFFILIATIONDetails: [in Japanese]
Date of correction: June 03, 2009Reason for correction: -Correction: CITATIONDetails: Right : 1) Sachs, G., and J. Weerts, Zeits. f. Phys., 64, 344 (1930). 2) Wever, F., and H. Möller, Arch. f. Eisenhüttenwes., 5, 215 (1931). 8) Schaal, A., Arch. Eisenhüttenwes, 26, 445 (1955).
