側傾法によるX線応力測定におけるX線入射方法の測定値に及ぼす影響

抄録

There are two directions of counter scanning when the stress measurement is made by means of X-rays. In the conventional method, the plane determined by the stress direction and the normal of the specimen is coincident with the plane determined by the direction of the incident X-ray and the direction of counter scanning. On the other hand, those two planes are perpendicular in the side inclination method, and In addition, X-ray beams must be irradiated from -η direction to the plane determined by the stress direction and the normal of the specimen. This side inclination method for stress measurement by means of X-rays is useful for measuring the stress in a complicated shape specimen.
When the measurement by the side inclination method is adopted with the apparatus used for the conventional method, however, it occurs quite often that the direction of X-ray beam has to be adjusted to coincident with the plane determined by the stress direction and the normal of the specimen. The value of stress calculated by the sin2Ψ method differs from the true value, depending upon the angle between the direction of stress and the principal axis.
In this study, the stress analysis is performed on the above incidental condition of X-ray beams and the values of stress are calculated numerically for several examples. Moreover, some results of the stress measurements are presented to prove the propriety of the present analysis.