1977 年 26 巻 280 号 p. 1-5
This paper describes the development of a portable detector-technique X-ray stress analyzer capable of measuring the residual stress of large-size structures, the half value width of diffraction lines, etc., and reports the results of actual measurements performed with this analyzer. The results are also useful as the data of materials strength.
The analyzer consists of four components, i.e. an X-ray generator, a goniometer, a heat exchanger and an electronic circuit panel. Each unit weighs approximately 18kg on an average and is designed to be carried with ease. This analyzer adopts the parallel beam optical system, Sin2ψ method and X-ray incident angle oscillation method, so that the accuracy of the measurement is equivalent to that of those equipments installed in laboratories for research work. Emphasis is placed on the improvement of operation through simplification of its function and construction and employment of automatic controls as much as possible, to obtain smooth operation even under severe conditions.
Moreover, the results of its practical applications on large-size structures, such as the detection of the effect of stress relief on welded parts performed in the field, showed that the change in residual stress before and after the annealing can clearly be obtained with this analyzer. Such measurement has not been conducted so far because reinstallation of existing analytical equipments is impractical.