1985 年 34 巻 380 号 p. 519-524
The effect of specimen curvature on X-ray stress measurement was investigated for the case of the side inclination method. The measured value of stress along the curved surface deviated from the true value with an increase in curvature and/or with an increase in irradiated size in the direction along the curvature.
An analytical method to calculate the apparent stress at a given true stress was developed. And the calibration curves for the curved surface measurement were presented.