電気抵抗法による2成分粒子系ランダムネス推定
サンプリング法
1988 年 37 巻 422 号 p. 1338-1343
詳細
1988 年 37 巻 422 号 p. 1338-1343
Previous studies for estimating randomness of a binary solid particle system have shown that the total electric resistance, RS calculated by an approximation method is closely related to the degree of mixing.
In this report, in order to estimate the randomness of the system, a parameter of short range disorder, σS was introduced as a criterion of the degree of mixing of the system. The short range disorder was difined as a ratio TC/TS, where TC represents the number of contact points between particles with different resistance (A particles and B particles) and TS represents the total number of contact points of all particles.
The values of degree of mixing obtained from two different methods (one is the spot sampling and the other is the total inspection) were compared with the values of the parameter of short range disorder. Furthermore, in order to assess these methods, the correlation functions between σS vs. σTL, σS, vs. σSL, σS vs. RS, σTL vs. RS and σSL vs. RS were calculated, where σS is the parameter of short-range disorder, σTL is the standard deviation of the total inspection, and σSL is the standard deviation of the spot sampling.
The computer simulated results showed that each correlation function described above is valid. Consequently, the total electric resistance calculated by an approximation (series and parallel) method can be used for the purpose of estimating randomness during the mixing process. However, in the spot sampling, the calculated values of degree of mixing was found to be affected by the number of samples and the sample size.
