X線応力測定法の基礎と最近の発展 5. 新素材への適用

鈴木 賢治; 日下 一也

doi:10.2472/jsms.48.308

The Fundamental Principles and Techniques of X-Ray Stress Measurement and Current in the Field

V: Application to Advanced Materials

Kenji SUZUKI, Kazuya KUSAKA

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Keywords: X-ray stress measurement, Ceramics, Thin film, Advanced materials, Residual stress

JOURNAL FREE ACCESS

1999 Volume 48 Issue 3 Pages 308-314

DOI https://doi.org/10.2472/jsms.48.308

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Published: March 15, 1999 Received: July 13, 1998 Available on J-STAGE: June 03, 2009 Accepted: July 13, 1998 Advance online publication: - Revised: -
Correction information
Date of correction: June 03, 2009 Reason for correction: - Correction: DTRECEIVED Details: Right : 19980713

Date of correction: June 03, 2009 Reason for correction: - Correction: TITLE Details: Wrong : Lecture
Right : The Fundamental Principles and Techniques of X-Ray Stress Measurement and Current in the Field

Date of correction: June 03, 2009 Reason for correction: - Correction: SUBTITLE Details: Right : V: Application to Advanced Materials

Date of correction: June 03, 2009 Reason for correction: - Correction: AUTHOR Details: Right : Kenji SUZUKI¹⁾, Kazuya KUSAKA²⁾

Date of correction: June 03, 2009 Reason for correction: - Correction: AFFILIATION Details: Right :
1) Dept. of Tech. & Living Sci., Niigata Univ.
2) Dept. of Mech. Eng., Tokushima Univ.

Date of correction: June 03, 2009 Reason for correction: - Correction: KEYWORD Details: Right : X-ray stress measurement, Ceramics, Thin film, Advanced materials, Residual stress

Date of correction: June 03, 2009 Reason for correction: - Correction: CITATION Details: Right : 7) K. Tanaka, Y. Yamamoto, N. Mine and K. Suzuki, Proc. 32nd Japan Conggress Mater. Res., 199 (1989).
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19) H. P. Kirchner, R. M. Gruver and R. E. Walker, J. Am.. Ceram. Soc., 56, 17 (1975).
24) S. Tanaka, “Residual Stress-III”, ed. by H. Fujiwara, T. Abe and K. Tanaka, p. 887 (1992) Elsevier Applied Science.
27) K. Tominaga and Y. Shintani, Japanese J. of Applied Phys., 28, Supplement, 7 (1989).
30) M. Nishida, T. Hanabusa and H. Fujiwara, Surf. Coat. Technol., 61, 47 (1993).
37) M. A. Korhonen and C. A. Paszkiet, Scripta Met., 23, 1449 (1989).
39) K. Kusaka, T. Hanabusa, M. Nishida and F. Inoko, Thin Solid Films, 290-291, 248 (1996).
41) M. Zaouali, J. L. Lebrun and P. Gergaud, Surf. Coat. Technol., 50, 5 (1991).
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46) S. Ejiri, T. Sasaki and Y. Hirose, Thin Solid Films, 307, 178 (1997).

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