2001 年 22 巻 12 号 p. 789-795
The photoelectron angular distribution (PEAD) from single-crystalline graphite is measured by using a two-dimensional display-type spherical mirror analyzer and a linearly polarized synchrotron radiation by varying the photon and photoelectron kinetic energies. From the study of the photon energy (hν) dependence of umklapp processes, it is found that their intensities are reduced considerably at hν = 50–60 eV. The mechanism of the umklapp process is discussed. The atomic orbitals composing the valence band is shown to be specified from the PEAD pattern by considering a transition matrix as well as umklapp processes. Furthermore, the band structure of graphite over the entire Brillouin zone is measured. The three-dimensional [EB-kx-ky] dispersion of the π and σ bands are extracted and presented for the first time.