表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:ウエットプロセスの新展開
単分子膜レジストとウエットプロセスによる微細加工
杉村 博之高井 治
著者情報
ジャーナル フリー

2001 年 22 巻 6 号 p. 364-369

詳細
抄録

Organosilane self-assembled monolayers (SAMs) have been applied to photoresists in a photolithography using vacuum-ultraviolet (VUV) light at 172 nm in wavelength. Although SAMs consisting only of alkyl chains are not photosensitive to UV lights used in conventional photolithographies, micropatterning of such SAMs were achieved through the dissociative excitation of the organic molecules and the subsequent oxidation reaction with activated oxygen species generated by VUV irradiation of atmospheric oxygen. Since this VUV photolithography is based on the photodecomposition of carbon-carbon bonds, the method, in principle, will be applicable to any organic thin films. Furthermore, pattern transfer techniques by the use of wet processes, that is, chemical etching, electroless plating and spatially regulated growth of mesostructured silica film, have been demonstrated.

著者関連情報

この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
前の記事 次の記事
feedback
Top