特集：フィールドエミッションの最近の進展
電界放射顕微鏡を用いた電界放射陰極列の電子放射特性の測定
2002 年 23 巻 1 号 p. 18-23
詳細
2002 年 23 巻 1 号 p. 18-23
Emission characteristics of individual micro emitters on a FEA have been measured by use of a laboratory made emission microscope. It was found that the total emission current is apparently stable, but the individual emitter current is unstable. The fluctuating modes can be classified into two categories: apparent dependence on the IP product, where I is total emission current and P is the residual gas pressure in the vacuum, and no such dependency. The former type of fluctuation is successfully interpreted by our model that ionic hitting from the gate electrode causes the fluctuation.
