2003 年 24 巻 5 号 p. 313-317
Inelastic tunneling spectroscopy (IETS) combined with scanning tunneling microscopy (STM) has attracted attentions since Wilson Ho group published clear experimental results by use of specially designed STM instruments. Although the results of STM-IETS have clearly shown the vibration features of molecules, their behavior is case sensitive and not straight forward unlike the data from conventional IETS measurements. We believe that accumulation of STM-IETS data on various molecules and surfaces are critical for the further development of this technique. In this context it is quite important to evaluate that commercially available STM machines are capable of obtaining such vibrational information. In this paper, our recent STM-IETS system using a commercially available STM is introduced, and the key issues for the successful measurement of STM-IETS are described. In addition of a single point STM-IETS measurement, we show mapping of vibrational feature using conventional software, which can contribute to the understanding of the mechanism and future chemical analysis.