2003 年 24 巻 9 号 p. 573-577
A new method for simultaneous measurement of topographic images and current-voltage (I-V) characteristics, based on atomic force microscopy (AFM), has been demonstrated with nano-scale resolution. Point-contact current-imaging atomic force microscopy (PCI-AFM) was developed to solve the incompatibility of electrically stable contact with nano-scale resolution in conductive probe AFM. We herein describe the detail of the PCI-AFM apparatus. Furthermore, the apparatus has been evaluated by the measurement of I-V characteristics of single-walled carbon nanotubes and deoxyribonucleic acid indicating high performance of PCI-AFM.