表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
連載企画
電子回折による波数空間測定
虻川 匡司
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2007 年 28 巻 6 号 p. 333-336

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New approaches in the measurements and analyses with LEED and RHEED lead us to another view of these techniques as a scan method for a wide-range of crystal reciprocal space. Recent progress of the constant momentum-transfer averaging (CMTA) method for LEED structure analysis and development of Weissenberg RHEED method, in which a principle of a Weissenberg Camera for X-ray crystallography was imported to RHEED measurements, are briefly introduced in this review. Both methods capture a huge number of diffraction patterns, and can survey a crystal reciprocal space in three dimension. It is possible to determine the surface structure directly from a simple analysis based on a Fourier transformation of the obtained reciprocal data.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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