2009 年 30 巻 1 号 p. 11-15
Development and potential applications of a three-dimensional X-ray absorption fine structure (XAFS) technique are described showing some preliminary data. By combining an X-ray microbeam with a depth-resolved XAFS technique, one can observe atomic, electronic and magnetic structures of thin film samples with a three-dimensional spatial resolution. A 3-5 μm beam size was achieved by adopting a two-step focusing mirror system, and two-dimensional magnetic images for a wedge-shaped Fe/Ni/Cu(100) thin film were obtained. On the other hand, the surface and interface components of XAFS spectra were extracted by applying the depth-resolved XAFS technique to a Ni/Cu(100) thin film. These results indicate that the three-dimensional XAFS measurements are now possible. Future prospects of this novel technique are also described.