表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:放射光表面科学部会特集 II
三次元XAFS法を用いた薄膜研究の可能性
雨宮 健太
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ジャーナル フリー

2009 年 30 巻 1 号 p. 11-15

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Development and potential applications of a three-dimensional X-ray absorption fine structure (XAFS) technique are described showing some preliminary data. By combining an X-ray microbeam with a depth-resolved XAFS technique, one can observe atomic, electronic and magnetic structures of thin film samples with a three-dimensional spatial resolution. A 3-5 μm beam size was achieved by adopting a two-step focusing mirror system, and two-dimensional magnetic images for a wedge-shaped Fe/Ni/Cu(100) thin film were obtained. On the other hand, the surface and interface components of XAFS spectra were extracted by applying the depth-resolved XAFS technique to a Ni/Cu(100) thin film. These results indicate that the three-dimensional XAFS measurements are now possible. Future prospects of this novel technique are also described.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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