回折分光法による電子・磁気構造の原子層分解解析

抄録

Photoelectron and Auger electron diffractions from a localized core level provide information on atomic configurations. Forward-focusing peaks indicate the directions of atoms surrounding the excited ones. X-ray absorption spectroscopy and X-ray magnetic circular dichroism measurements by Auger electron yield detection, on the other hand, are powerful analysis tools for the electronic and magnetic structures of surfaces. However, all the information from atoms within the electron mean-free-path range is averaged into the obtained spectra. Here, we introduce a new method of disentangling spectra from different atomic layers by use of Auger electron diffraction. Taking an advantage of the forward-focusing peak as an excellent element- and site-selective probe, diffraction spectroscopy enables direct access to the electronic and magnetic structures at subsurface region. We have applied this method to the study of the electronic and magnetic structures of Ni thin film at atomic level.