特集：メスバウア分光
顕微メスバウア分光装置の開発と応用
2010 年 31 巻 5 号 p. 255-260
詳細
2010 年 31 巻 5 号 p. 255-260
A “Mössbauer spectroscopic microscope” is presented in this review article. The microscope uses a Multi-Capillary-X-ray (MCX) lens to focus 14.4 keV-γ-rays. It is operating in a laboratory combined with a field emission type scanning electron microscope (FE-SEM). This microscope yields a two-dimensional mapping image of 57Fe probes with a space resolution of about 50 μm in comparison with the microstructure observed by FE-SEM. The detection limit for 57Fe atoms appears to be less than 1016 57Fe/cm3 in Si matrix. We detect “57Fe Mössbauer effect” either by 14.4 keV-γ-rays or characteristic X-rays of Fe on Si-PIN detector or by conversion electrons and Auger electrons on micro-channel plate (MCP) as function of the focused γ-ray positions. Two examples of the applications of this microscope are shown: one for SUS304 steel which contains Austenite and Martensite phases, and the other for 57Fe contaminated multi-crystalline Si which is used for solar cells.
