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表面科学
Vol. 35 (2014) No. 4 p. 190-195

記事言語:

http://doi.org/10.1380/jsssj.35.190

特集:有機半導体デバイスにおける構造と電子物性

Two-dimensional grazing incidence X-ray diffraction (2D-GIXD) is one of the powerful methods to analyze crystal growth and structure of organic thin films. In this report, we show some experimental examples of 2D-GIXD measurements on organic semiconductor thin-films performed at SPring-8. First, polymorphic transformation of pentacene depending on film thickness observed by means of in-situ real-time 2D-GIXD is shown. Secondly, real-time observation of change in structure during thin-film growth of oligothiophenes by means of 2D-GIXD is shown. Finally, a result of crystal structure analysis from 2D-GIXD data of polycrystalline an oligothiophene thin film is reported.

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