表面科学
特集:有機半導体デバイスにおける構造と電子物性
放射光を用いた有機薄膜成長の2次元X線回折その場観察
吉本 則之渡辺 剛小金澤 智之菊池 護廣沢 一郎
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35 巻 (2014) 4 号 p. 190-195

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Two-dimensional grazing incidence X-ray diffraction (2D-GIXD) is one of the powerful methods to analyze crystal growth and structure of organic thin films. In this report, we show some experimental examples of 2D-GIXD measurements on organic semiconductor thin-films performed at SPring-8. First, polymorphic transformation of pentacene depending on film thickness observed by means of in-situ real-time 2D-GIXD is shown. Secondly, real-time observation of change in structure during thin-film growth of oligothiophenes by means of 2D-GIXD is shown. Finally, a result of crystal structure analysis from 2D-GIXD data of polycrystalline an oligothiophene thin film is reported.

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