表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
第35回表面科学学術講演会特集号 [II]
MS/MSを搭載したTOF-SIMSによる有機材料表面の化学構造解析
飯田 真一Gregory L. FISHERJohn S. HAMMONDScott R. BRYAN宮山 卓也
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2016 年 37 巻 8 号 p. 354-358

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Recently, applications of TOF-SIMS have expanded into a wide variety of organic materials, because the sensitivity of high mass molecular ions was improved dramatically. However, it was very difficult to determine the chemical formula from the measured mass above m/z 200. The ambiguous peak identification was a significant problem in TOF-SIMS. In order to determine the chemical formula as well as detailed chemical structure, we developed the TOF-SIMS instrument equipped with MS/MS, and applied it to the various organic materials. In this article, we will introduce this unique instrument, and demonstrate the results of the spectra analyses by using MS/MS.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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