表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集: 多様な表面科学を支える放射光
軌道磁気量子数計測:現象の理解と応用
松井 文彦
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2017 年 38 巻 11 号 p. 542-547

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Core-level photoelectron diffraction provides element-specific atomic structure information. Forward focusing peaks (FFPs) indicate the directions of atoms surrounding a photoelectron emitter atom. When a core level is excited by circularly polarized light, angular momentum of light is transferred to an emitted photoelectron, which can be confirmed by the parallax shift measurement of FFP direction. Here I report the new observation and quantitative analysis of the angular momentum transfer from light to Auger electrons, and compare them with the photoelectron cases. Angularmomentum-polarized Cu LMM Auger electrons at the L absorption threshold, where the excited core electron is trapped at the conduction band, were detected. By setting an analyzer at the corresponding position in the FFP direction, the Auger electron with a specific angular momentum can be selectively detected. In the case of magnetic materials, circular dichroism in the X-ray absorption intensity was observed together with angular momentum transfer (parallax shift) effect.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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