表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
第36回表面科学学術講演会特集号 [II]
ラウエ型湾曲結晶分光器による高感度XAFS
脇坂 祐輝岩崎 裕也上原 広充向井 慎吾城戸 大貴高草木 達上村 洋平和田 敬広Qiuyi YUAN関澤 央輝宇留賀 朋哉岩澤 康裕朝倉 清高
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38 巻 (2017) 8 号 p. 378-383

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A log-spirally bent crystal Laue analyzer has been investigated and developed for highly sensitive in situ surface X-ray absorption fine structure (XAFS) measurement. Both calculations and experiments were conducted to obtain its intensity distributions on the different positions of the analyzer. A home-made log-spirally bent crystal Laue analyzer was made and evaluated. It was revealed that higher XAFS signals were obtained with the home-made analyzer than with the commercial one.

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